Journalartikel

Autorenliste: Demuth, Thomas; Fuchs, Till; Beyer, Andreas; Janek, Jürgen; Volz, Kerstin

Jahr der Veröffentlichung: 2024

Zeitschrift: Ultramicroscopy

Bandnummer: 257

ISSN: 0304-3991

eISSN: 1879-2723

Open Access Status: Hybrid

DOI Link: https://doi.org/10.1016/j.ultramic.2023.113904

Verlag: Elsevier

Abstract: 
Interfacial phenomena between active cathode materials and solid electrolytes play an important role in the function of solid-state batteries. (S)TEM imaging can give valuable insight into the atomic structure and composition at the various interfaces, yet the preparation of TEM specimen by FIB (focused ion beam) is challenging for loosely bound samples like composites, as they easily break apart during conventional preparation routines. We propose a novel preparation method that uses a frame made of deposition layers from the FIB's gas injection system to prevent the sample from breaking apart. This technique can of course be also applied to other loosely bound samples, not only those in the field of batteries.

Harvard-Zitierstil: Demuth, T., Fuchs, T., Beyer, A., Janek, J. and Volz, K. (2024) "Depo-all-around": A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples, Ultramicroscopy, 257, Article 113904. https://doi.org/10.1016/j.ultramic.2023.113904

APA-Zitierstil: Demuth, T., Fuchs, T., Beyer, A., Janek, J., & Volz, K. (2024). "Depo-all-around": A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples. Ultramicroscopy. 257, Article 113904. https://doi.org/10.1016/j.ultramic.2023.113904