Journalartikel

Autorenliste: Rohnke, M; Janek, J; Kilner, JA; Chater, RJ

Jahr der Veröffentlichung: 2004

Seiten: 89-102

Zeitschrift: Solid State Ionics

Bandnummer: 166

Heftnummer: 1-2

ISSN: 0167-2738

Open Access Status: Green

DOI Link: https://doi.org/10.1016/j.ssi.2003.10.005

Verlag: Elsevier

Abstract: 
Isotope Exchange/Depth Profiling (IEDP) using Secondary Ion Mass Spectrometry (SIMS) has been used to determine the oxygen tracer diffusion and surface exchange coefficients of (100) oriented 9.5 mol% yttria stabilised zirconia single crystals. Exchange experiments performed with molecular oxygen are compared with the exchange using an oxygen plasma. The surface exchange coefficient for specimens in a plasma is up to 100 times higher compared to measurements with normal molecular oxygen. For the exchange experiments we used an inductively coupled radio frequency (rf) oxygen plasma with a maximum radio frequency power of 250 W Double probe measurements and optical emission spectrometry are used for the characterisation of the plasma. The measured electron temperatures are within the range of 5-12 eV.

Harvard-Zitierstil: Rohnke, M., Janek, J., Kilner, J. and Chater, R. (2004) Surface oxygen exchange between yttria-stabilised zirconia and a low-temperature oxygen rf-plasma, Solid State Ionics, 166(1-2), pp. 89-102. https://doi.org/10.1016/j.ssi.2003.10.005

APA-Zitierstil: Rohnke, M., Janek, J., Kilner, J., & Chater, R. (2004). Surface oxygen exchange between yttria-stabilised zirconia and a low-temperature oxygen rf-plasma. Solid State Ionics. 166(1-2), 89-102. https://doi.org/10.1016/j.ssi.2003.10.005